Journal
OPTICAL AND QUANTUM ELECTRONICS
Volume 49, Issue 7, Pages -Publisher
SPRINGER
DOI: 10.1007/s11082-017-1057-9
Keywords
Chalcogenide glasses; Refractive index; Dispersion
Funding
- Naval Research Laboratory (Washington D.C. USA)
- EPSRC [EP/P013708/1] Funding Source: UKRI
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The well-known method presented by Swanepoel can be used to determine the refractive index dispersion of thin films in the near-infrared region from wavelength values at maxima and minima, only, of the transmission interference fringes. In order to extend this method into the mid-infrared spectral region (our measurements are over the wavelength range from 2 to 25 mu m), the method is improved by using a two-term Sellmeier model instead of the Cauchy model as the dispersive equation. Chalcogenide thin films of nominal batch composition As40Se60 (at.%) and Ge16As24Se15.5Te44.5 (at.%) are prepared by a hot-pressing technique. The refractive index dispersion of the chalcogenide thin films is determined by the improved method with a standard deviation of less than 0.0027. The accuracy of the method is shown to be better than 0.4% at a wavelength of 3.1 mu m by comparison with a benchmark refractive index value obtained from prism measurements on Ge16As24Se15.5Te44.5 material taken from the same batch.
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