A discrete host-parasitoid model with development of pesticide resistance and IPM strategies

The development of pesticide resistance significantly affects the outcomes of pest control. A quantitative depiction of the effects of pesticide resistance development on integrated pest management (IPM) strategies and pest control outcomes is challenging. To address this problem, a discrete host-parasitoid model with pesticide resistance development and IPM strategies is proposed and analyzed. The threshold condition of pest eradication which reveals the relationship between the development of pest resistance and the rate of natural enemy releases is provided and analyzed, and the optimal rate for releasing natural enemies was obtained based on this threshold condition. Furthermore, in order to reduce adverse effects of the pesticide on natural enemies, the model has been extended to consider the spraying of pesticide and releases of natural enemies at different times. The effects of the dynamic complexity and different resistance development equations on the main results are also discussed.