Journal
NANOSCALE
Volume 9, Issue 23, Pages 7771-7780Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/c7nr01480e
Keywords
-
Categories
Funding
- University of Maryland [70NANB10H193]
- National Institute of Standards and Technology Center for Nanoscale Science and Technology through the University of Maryland [70NANB10H193]
- MRSEC Program of NSF [DMR-1121252]
Ask authors/readers for more resources
Improving the power conversion efficiency of photovoltaic (PV) devices is challenging because the generation, separation and collection of electron-hole pairs are strongly dependent on details of the nanoscale chemical composition and defects which are often poorly known. In this work, two novel scanning probe nano-spectroscopy techniques, direct-transmission near-field scanning optical microscopy (dt-NSOM) and photothermal induced resonance (PTIR), are implemented to probe the distribution of defects and the bandgap variation in thin lamellae extracted from polycrystalline CdTe PV devices. dt-NSOM provides high-contrast spatially-resolved maps of light transmitted through the sample at selected wavelengths. PTIR provides absorption maps and spectra over a broad spectral range, from visible to mid-infrared. Results show variation of the bandgap through the CdTe thickness and from grain to grain that is spatially uncorrelated with the distributions of shallow and deep defects.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available