Journal
NANO LETTERS
Volume 17, Issue 11, Pages 6526-6533Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.7b01924
Keywords
scattering-type scanning near-field optical microscopy (s-SNOM); terahertz s-SNOM; graphene detector; resonant near-field probes; terahertz antennas; focused ion beam (FIB) machining; terahertz nanoscopy
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Funding
- European Commission under the Graphene Flagship [CNECT-ICT-604391]
- Spanish Ministry of Economy and Competitiveness [MAT2015-65525-R, MAT2014-53432-C5-4-R]
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We developed THz-resonant scanning probe tips, yielding strongly enhanced and nanoscale confined THz near fields at their tip apex. The tips with length in the order of the THz wavelength (lambda = 96.5 mu m) were fabricated by focused ion beam (FIB) machining and attached to standard atomic force microscopy (AFM) cantilevers. Measurements of the near-field intensity at the very tip apex (25 nm radius) as a function of tip length, via graphene-based (thermoelectric) near-field detection, indicate their first and second order geometrical antenna resonances for tip length of 33 and 78 mu m, respectively. On resonance, we find that the near-field intensity is enhanced by one order of magnitude compared to tips of 17 mu m length (standard AFM tip length), which is corroborated by numerical simulations that further predict remarkable intensity enhancements of about 10(7) relative to the incident field. Because of the strong field enhancement and standard AFM operation of our tips, we envision manifold and straightforward future application in scattering-type THz near-field nanoscopy and THz photocurrent nano imaging, nanoscale nonlinear THz imaging, or nano scale control and manipulation of matter employing ultrastrong and ultrashort THz pulses.
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