Journal
NANO LETTERS
Volume 17, Issue 3, Pages 1409-1416Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acs.nanolett.6b04360
Keywords
van der Waals heterostructures; graphene; hexagonal boron nitride; scanning transmission electron microscopy
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Funding
- European Research Council (ERC) [336453-PICOMAT]
- FWF [P25721-N20]
- Wiener Wissenschafts-Forschungs- and Technologiefonds (WWTF) [MA14-009]
- European Union [655760 - DIGIPHASE]
- European Research Council (ERC)
- EPSRC [EP/N010345/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/N010345/1] Funding Source: researchfish
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In this work we demonstrate that a free-standing van der Waals heterostructure, usually regarded as a flat object, can exhibit an intrinsic buckled atomic structure resulting from the interaction between two layers with a small lattice mismatch. We studied a freely suspended membrane of well-aligned graphene on a hexagonal boron nitride (hBN) monolayer by transmission electron microscopy (TEM) and scanning TEM (STEM). We developed a detection method in the STEM that is capable of recording the direction of the scattered electron beam and that is extremely sensitive to the local stacking of atoms. A comparison between experimental data and simulated models shows that the heterostructure effectively bends in the out-of-plane direction, producing an undulated structure having a periodicity that matches the moire wavelength. We attribute this rippling to the interlayer interaction and also show how this affects the intralayer strain in each layer.
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