Journal
ELECTROCHIMICA ACTA
Volume 165, Issue -, Pages 301-313Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.electacta.2015.03.020
Keywords
Plasma electrolytic oxidation; Ti-6Al-4V; Zircaloy; Dielectric; Semiconductor
Categories
Funding
- National Science Foundation of China [51071066]
- Program for New Century Excellent Talents in University of the Education Ministry of China [NCET-12-0172]
- Engineering and Physical Sciences Research Council (U.K.) [LATEST2]
- EPSRC [EP/H020047/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/H020047/1] Funding Source: researchfish
Ask authors/readers for more resources
Plasma electrolytic oxidation of Ti-6Al-4V and Zircaloy-2 alloys in a silicate-hexametaphosphate electrolyte has been studied in detail by various methods, including scanning electron microscopy, transmission electron microscopy and electrochemical techniques. Different coating growth kinetics, formation efficiencies and microstructures have been revealed for the two alloys. From these results, it is suggested that the insulating nature of the coating on Zircaloy-2 promotes the formation of pancake structures, which are formed by strong discharges. In contrast, the semiconducting properties of the coating on the Ti-6Al-4V alloy promote oxygen evolution, reduce the efficiency of coating growth and favour surface or shallow discharges that result in coral reef coating features. Anomalous gas evolution, which is more abundant with Zircaloy-2, was observed on both alloys after the appearance of stronger discharges. However, the current density used for the oxygen generation on Zircaloy-2 was still less than that of the Ti-6Al-4V alloy. (C) 2015 Elsevier Ltd. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available