4.7 Article

Nascent SEI-Surface Films on Single Crystalline Silicon Investigated by Scanning Electrochemical Microscopy

Journal

ACS APPLIED ENERGY MATERIALS
Volume 2, Issue 2, Pages 1388-1392

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsaem.8b01967

Keywords

silicon electrode; single crystalline electrode; solid electrolyte interphase; scanning electrochemical microscopy; incremental charging

Funding

  1. Conselho Nacional de Desenvolvimento Cientifico e Tecnologico (Brazil) [233204/2014-8]
  2. Austrian Federal Ministry of Science, Research, and Economy
  3. Austrian National Foundation for Research, Technology, and Development
  4. Federal Ministry of Education and Research [03XP0125C]

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Silicon is a promising high-capacity host material for negative electrodes in lithium-ion batteries with low potential for the lithiation/delithiation reaction that is outside the stability window of organic carbonate electrolytes. Thus, the use of such electrodes critically depends on the formation of a protective solid electrolyte interphase (SEI) from the decomposition products of electrolyte components. Due to the large volume change upon charging, exposure of the electrode material to the electrolyte must be expected, and facile reformation of SEI is a scope for improving the stabilities of such electrodes. Here, we report the formation of incipient SEI layers on monocrystalline silicon by in situ imaging of their passivating properties using scanning electrochemical microscopy after potentiodynamic charging to different final potentials. The images show a local initiation of the SEI growth at potentials of around 1.0 V vs Li/Li+ in 1 M LiClO4 in propylene carbonate.

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