Journal
NANOPHOTONICS
Volume 8, Issue 3, Pages 467-474Publisher
WALTER DE GRUYTER GMBH
DOI: 10.1515/nanoph-2018-0205
Keywords
polarimetry; Stokes measurement; polarization; silicon photonics
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Funding
- National Natural Science Foundation of China [61775073, 61475050]
- New Century Excellent Talent Project in Ministry of Education of China [NCET-13-0240]
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Polarization measurement has been widely used in material characterization, medical diagnosis and remote sensing. However, existing commercial polarization analyzers are either bulky schemes or operate in non-real time. Recently, various polarization analyzers have been reported using metal metasurface structures, which require elaborate fabrication and additional detection devices. In this paper, a compact and fully integrated silicon polarization analyzer with a photonic crystal-like metastructure for polarization manipulation and four subsequent on-chip photodetectors for light-current conversion is proposed and demonstrated. The input polarization state can be retrieved instantly by calculating four output photocurrents. The proposed polarization analyzer is complementary metal oxide semiconductor-compatible, making it possible for mass production and easy integration with other silicon-based devices monolithically. Experimental verification is also performed for comparison with a commercial polarization analyzer, and deviations of the measured polarization angle are <+/- 1.2%.
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