Transmission Electron Microscopy of Halide Perovskite Materials and Devices

Transmission electron microscopy (TEM)-based techniques are uniquely suited for site-specific structural and analytical characterization of halide perovskites (HPs) at atomic, nanometer, and micrometer length scales. TEM-based studies hold the key to understanding the nature and functionality of these fascinating materials that are at the heart of emerging solar cells and (opto) electronic devices. While TEM-based techniques have made several groundbreaking discoveries that have resulted in astonishing advancements in the field of materials science in general over the past decades, their application to HPs has been relatively sparse. Here, we provide a perspective on TEM-based studies of HPs that have been conducted so far and project a vision for how these powerful characterization techniques can be brought to bear on research problems in the field of HPs. An outlook discussing important challenges and opportunities that lay ahead is also presented.