Journal
MATERIALS SCIENCE-MEDZIAGOTYRA
Volume 23, Issue 3, Pages 193-199Publisher
KAUNAS UNIV TECH
DOI: 10.5755/j01.ms.23.3.16225
Keywords
Ba1-xErxTiO3; sol-gel; X-ray line profile analysis; crystallite size; microstrain
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Funding
- Fundamental Research Grant Scheme (FRGS) - Ministry of Higher Education (KPT) [9003-00479]
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Perovskite erbium doped barium titanate (Ba1-xErxTiO3) thin films, at different x values, have been fabricated on SiO2/Si substrate and characterized using X-ray diffraction (XRD) in the range of 20 degrees to 60 degrees to study the phase structure and geometric parameters for the films. XRD patterns show a broadening and shifting for the perovksite peaks toward higher angle due to Er3+ doping. The effect of Er3+ substitution into BaTiO3 lattice has been deeply investigated using X-ray line profine analysis through Scherrer equation, Williamson-Hall and size-strain plot (SSP) approaches. For all approaches used, it has been found that the crystallite size for the films decreases as the value of x increases, which is attributed to the relatively small Er3+ ionic size compared to Ba2+. In Williamson-Hall and SSP analysis, it is found that the microstrain created due to Er3+ doping causes distortion for the lattice and broadening for perovskite peaks as a result. Among all approaches used in this work, SSP shows to be the most suitable for this type of materials by giving the best fitted plots and goodness of fit R-2 close to 1.
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