Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 66, Issue -, Pages 157-161Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2017.04.019
Keywords
CaCu3Ti4O12 thin films; RF magnetron sputtering; Optical properties
Categories
Funding
- Universiti Sains Malaysia (USM) [APEX 91002/JHEA/ATSG4001]
- fundamental research grant scheme (FRGS) [203/PBAHAN/6071263]
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This study focusses on the investigation of RF power variations (100-300 W) effects on structural, morphological and optical properties of CaCu3Ti4O12 thin film deposited on ITO/glass substrate in a non-reactive atmosphere (Ar). The increase of RF power from 100 W to 300 W led to evolution of (112), (022), (033), and (224) of CCTO XRD peaks. The results indicated that all the films were polycrystalline nature with cubic structure. The crystallite size increased from 20 nm to 25 nm with increasing RF power. FESEM revealed that the films deposited were uniform, porous with granular form, while the grain size increased from 30 to 50 nm. AFM analysis confirmed the increment in surface roughness from 1.6 to 2.3 nm with increasing film grain size. Besides, optical transmittance values decreased to minimum 70% with increasing RF power while optical energy bandgap increased from 3.20 eV to 3.44 eV. Therefore, favorable CCTO thin film properties can be possibly obtained for certain application by controlling RF magnetron sputtering power.
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