Journal
MATERIALS RESEARCH BULLETIN
Volume 86, Issue -, Pages 215-219Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.materresbull.2016.11.015
Keywords
Nanostructures; Thin films; Optical properties; Sputtering; X-ray diffraction
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Novel ZnO combined structures were obtained using the radio frequency (RF) sputtering method. The effects of two different substrates, Si and 128 degrees YX LiNbO3, on the structural, morphological, and optical properties of ZnO films were investigated. Field emission scanning electron microscopy clearly revealed the formation of a mixed flake-corolla lobe-like structure. The grain size of the obtained structure depended on the substrate type. Two different X-ray diffraction peaks were obtained for ZnO growth on LiNbO3, at the (200) and (201) diffraction planes, respectively. (C) 2016 Elsevier Ltd. All rights reserved.
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