Journal
MATERIALS LETTERS
Volume 186, Issue -, Pages 45-48Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.matlet.2016.09.093
Keywords
Thin films; Physical vapor deposition; Physical properties; Substrates; Optical materials and properties
Funding
- University Grants Commission (UGC), New Delhi [42-828/2013(SR)/MRP]
- UGC [5-1/2013(IC)]
- Indo-US Science and Technology Forum (IUSSTF), New Delhi [BASE-2016/I/6]
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CdZnTe thin films of thickness 300 nm were deposited on glass, ITO, FTO and silicon wafer at room temperature employing electron beam vacuum evaporation. These deposited films were analyzed using XRD, source meter and UV-Vis spectrophotometer to investigate structural, electrical and optical properties, respectively. The films are found to be polycrystalline in nature with zinc-blende cubic structure and evaluated structural parameters show significant effect of used substrates. The electrical study shows that the conductivity is maximum for films deposited on FTO substrate. The optical analysis shows wide transmittance with the energy band gap in the range 1.71-2.28 eV.
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