Journal
IEEE ACCESS
Volume 7, Issue -, Pages 46084-46091Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/ACCESS.2019.2908885
Keywords
Microwave imaging; subsurface imaging; optical inspection technology
Categories
Funding
- National Research Foundation of Korea (NRF) - Ministry of Education [NRF-2018R1D1A1B07047984]
- National Research Foundation of Korea [2015R1D1A1A02061824, 2009-0093822]
- International Cooperation Program by the National Research Foundation of Korea [NRF-2018K2A9A1A01090496]
- National Research Foundation of Korea [2015R1D1A1A02061824, 2009-0093822] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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We present a new method for the subsurface imaging of a conductive object embedded in a dielectric medium based on microwave imaging by thermo-elastic optical indicator microscopy. The present method is based on the imaging of the microwave near field distribution generated by a conductive object embedded in a dielectric medium. When the thickness of the dielectric medium is small so that the microwave near field generated by the conductive object can emerge from the dielectric medium, one can find the presence of the object by visualizing the microwave distribution appearing on the surface of the medium. By using the present method, we visualized the microwave field distribution appearing on a surface of a dielectric medium containing a conductive object with an irradiating microwave. We observed that strong microwave near fields that were present around the conductive object appeared on the surface of the dielectric medium, and their intensities were dependent on the frequency and polarization direction of the irradiated microwave. By visualizing various conductive lines having different lengths of 4 similar to 10 mm with a width of 1 mm, and buried depths of 1 similar to 5 mm, we showed that the present method can be a practical nondestructive and noncontact way for the detection of conductive lines and structures embedded in an optically opaque dielectric medium.
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