Journal
IEEE ACCESS
Volume 7, Issue -, Pages 48060-48067Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/ACCESS.2019.2907742
Keywords
Millimeter wave; near-field; FDTD; high resolution; background noise
Categories
Funding
- National Key Research and Development Program of China [2017YFF0106303, 2016YFC0101002, 2016YFC0101301]
- National Natural Science Foundation of China [61875196, 11604332]
- Chongqing Science and Technology Commission [cstc2018jcyjAX0405]
- Chinese Academy of Sciences
- Central Government Supported Key Instrument Program of China [YXGYQ201700136]
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A home-built scattering-type scanning near-field millimeter-wave microscope based on a 110-GHz continuous-wave solid-state source is demonstrated with a spatial resolution of 1 mu m, approximately 1/3000 of the incident wavelength, and a signal-to-noise ratio of 23.8 dB. The relationship between the length of the tip (antenna) and the wavelength for resonant enhancement, and the near-field distribution around the tip apex at different tip-sample separations were explored using finite-difference time-domain electromagnetic simulations to facilitate the design of the microscope. The dependence of the spatial resolution on the tip-sample separation and the harmonic order of the modulation frequency at which the near-field signal was extracted has been investigated experimentally and discussed in terms of the signal-to-noise ratio and the standard deviation of the demodulated signal.
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