4.6 Article

W-Band Near-Field Microscope

Journal

IEEE ACCESS
Volume 7, Issue -, Pages 48060-48067

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/ACCESS.2019.2907742

Keywords

Millimeter wave; near-field; FDTD; high resolution; background noise

Funding

  1. National Key Research and Development Program of China [2017YFF0106303, 2016YFC0101002, 2016YFC0101301]
  2. National Natural Science Foundation of China [61875196, 11604332]
  3. Chongqing Science and Technology Commission [cstc2018jcyjAX0405]
  4. Chinese Academy of Sciences
  5. Central Government Supported Key Instrument Program of China [YXGYQ201700136]

Ask authors/readers for more resources

A home-built scattering-type scanning near-field millimeter-wave microscope based on a 110-GHz continuous-wave solid-state source is demonstrated with a spatial resolution of 1 mu m, approximately 1/3000 of the incident wavelength, and a signal-to-noise ratio of 23.8 dB. The relationship between the length of the tip (antenna) and the wavelength for resonant enhancement, and the near-field distribution around the tip apex at different tip-sample separations were explored using finite-difference time-domain electromagnetic simulations to facilitate the design of the microscope. The dependence of the spatial resolution on the tip-sample separation and the harmonic order of the modulation frequency at which the near-field signal was extracted has been investigated experimentally and discussed in terms of the signal-to-noise ratio and the standard deviation of the demodulated signal.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available