4.2 Article

Dielectric study of Ti-doped Bi2VO5.5 solid electrolyte

Journal

INDIAN JOURNAL OF PHYSICS
Volume 93, Issue 7, Pages 845-859

Publisher

INDIAN ASSOC CULTIVATION SCIENCE
DOI: 10.1007/s12648-018-1356-4

Keywords

BITIVOX; XRD; Phase transition; Ionic conduction; Dielectric relaxation

Funding

  1. DST, New Delhi [SB/52/CMP-093/2013]
  2. DST, New Delhi

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Synthesis and characterization of Bi2V1-xTixO5.5-(x/2)- (0x0.150) was done. For the present system, the lower limit of Ti required for near-complete tetragonal phase stabilization has been found to be x=0.125. The optimum values of ionic conductivity were obtained for the compositions; Bi2V0.875Ti0.125O5.4375 and Bi2V0.9Ti0.1O5.45 at 300 degrees C and 600 degrees C, respectively. Interestingly, two peaks have been observed in frequency versus dielectric loss spectra for parent compound, which is in -orthorhombic phase, as well as for tetragonal phase stabilized specimens with compositions x0.125 at temperatures below 300 degrees C. No such peaks have been found in -orthorhombic (x=0.085) as well as in mixed tetragonal and orthorhombic (x=0.1 and 0.1125) phases. Thus, we propose that frequency-dependent dielectric loss spectra can be used to qualitatively distinguish and -phases from -phase in BITIVOX system and it is the central result of this work.

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