Journal
ACS APPLIED POLYMER MATERIALS
Volume 1, Issue 5, Pages 933-938Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsapm.9b00189
Keywords
near-field optical microscopy; subsurface imaging; atomic force microscopy; mechanical properties; block copolymer; thin film
Funding
- Natural Sciences and Engineering Research Council of Canada [RGPIN-2016-06448]
- Canada Foundation for Innovation [30516]
- The Netherlands Organization for Scientific Research (NWO)
- University of Twente Stimuleringsfonds
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Block copolymer (BCP) thin films are commonly characterized by techniques that either lack nanometric spatial resolution or the ability for subsurface characterization. In this work, we combine scanning near-field optical microscopy and atomic force microscopy mechanical mapping to probe the subsurface composition of poly(styrene-block-tert-butyl acrylate) thin film with nanometric spatial resolution and compare our results to a theoretical description. Our work demonstrates a novel imaging approach for interrogating the internal morphology of BCP thin films. A better understanding of subsurface morphologies will enable better design principles for nanolithography and templating thin films for photonics, photovoltaics, and tissue engineering.
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