Journal
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 29, Issue 45, Pages -Publisher
IOP Publishing Ltd
DOI: 10.1088/1361-648X/aa8b92
Keywords
NAP-XPS; solid/liquid interface; surface science; in situ spectroscopy
Categories
Funding
- European Union Seventh Framework Programme [604391]
- EPSRC (UK) [EP/K016954/1]
- EPSRC [EP/K016954/1, EP/P025021/1] Funding Source: UKRI
- STFC [ST/K00171X/1, ST/N002385/1] Funding Source: UKRI
- Engineering and Physical Sciences Research Council [EP/K016954/1] Funding Source: researchfish
- Science and Technology Facilities Council [ST/K00171X/1, ST/N002385/1] Funding Source: researchfish
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The routine study of the solid-water interface by XPS is potentially revolutionary as this development opens up whole new areas of study for photoelectron spectroscopy. To date this has been realised by only a few groups worldwide and current techniques have significant restrictions on the type of samples which can be studied. Here we present a novel and uniquely flexible approach to the problem. By introducing a thin capillary into the NAP-XPS, a small droplet can be injected onto the sample surface, offset from the analysis area by several mm. By careful control of the droplet size a water layer of controllable thickness can be established in the analysis area-continuous with the bulk droplet. We present results from the solid-water interface on a vacuum prepared TiO2(110) single crystal and demonstrate that the solid/liquid interface is addressable.
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