4.5 Article

Domain wall magnetoresistance in BiFeO3 thin films measured by scanning probe microscopy

Journal

JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 29, Issue 33, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.1088/1361-648X/aa7a24

Keywords

domain walls; BiFeO3; multiferroic; magnetoresistance; atomic force microscope; scanning probe microscopy

Funding

  1. MINECO [MAT2016-77100-C2-1-P, FIS2015-73932-JIN]
  2. Generalitat de Catalunya [2014-SGR-1216]
  3. Ramon y Cajal [RYC-2010-06365]
  4. Spanish MINECO through the Severo Ochoa Centers of Excellence [SEV-2013-0295]

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We measure the magnetotransport properties of individual 71 degrees domain walls in multiferroic BiFeO3 by means of conductive-atomic force microscopy (C-AFM) in the presence of magnetic fields up to one Tesla. The results suggest anisotropic magnetoresistance at room temperature, with the sign of the magnetoresistance depending on the relative orientation between the magnetic field and the domain wall plane. A consequence of this finding is that macroscopically averaged magnetoresistance measurements for domain wall bunches are likely to underestimate the magnetoresistance of each individual domain wall.

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