Journal
JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume 50, Issue 50, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1361-6463/aa95b3
Keywords
transparent conductor; radio frequency magnetron sputtering; figure of merit; hole conducting
Categories
Funding
- Solar Energy Research Institute for India and the US (SERIIUS) - US Department of Energy [DE AC36-08G028308]
- Government of India [IUSSTF/JCERDC-SERIIUS/2012]
- Department of Science and Technology (DST) India
- Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the US Department of Energy [DE-AC02-05CH11231]
- Office of Science of the US Department of Energy [DE-SC0004993]
- chinese scholarship council
- Solar Energy Research Institute for India and the US (SERIIUS) - US Department of Energy (Office of Science) [DE AC36-08G028308]
- Solar Energy Research Institute for India and the US (SERIIUS) - US Department of Energy (Office of Basic Energy Sciences) [DE AC36-08G028308]
- Solar Energy Research Institute for India and the US (SERIIUS) - US Department of Energy (Energy Efficiency and Renewable Energy) [DE AC36-08G028308]
- Solar Energy Research Institute for India and the US (SERIIUS) - US Department of Energy (Solar Energy Technology Program) [DE AC36-08G028308]
- Solar Energy Research Institute for India and the US (SERIIUS) - US Department of Energy (Office of International Affairs) [DE AC36-08G028308]
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p-type transparent conducting Cu alloyed ZnS thin films from CuxZn1-xS targets (x = 0.1, 0.2, 0.3, 0.4, and 0.5) were deposited on glass substrates via radio frequency sputtering. x-ray diffraction and TEM-SAED analysis show that all the films have sphalerite ZnS as the majority crystalline phase. In addition, films with 30% and 40% Cu show the presence of increasing amounts of crystalline Cu2S phase. Conductivity values. 400 S cm(-1) were obtained for the films having 30% and 40% Cu, with the maximum conductivity of 752 S cm(-1) obtained for the film with 40% Cu. Temperature dependent electrical transport measurements indicate metallic as well as degenerate hole conductivity in the deposited films. The reflection-corrected transmittance of this Cu alloyed ZnS (40% Cu) film was determined to be. 75% at 550 nm. The transparent conductor figure of merit (Phi(TC)) of the Cu alloyed ZnS (40% Cu), calculated with the average value of transmittance between 1.5 to 2.5 eV, was approximate to 276 mu S.
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