4.6 Article

Excellent thermal stability and low dielectric loss of (1-x)BaTiO3-xBi(Li0.5Nb0.5)O3 solid solutions in a broad temperature range applied in X8R

Journal

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Volume 28, Issue 22, Pages 17278-17282

Publisher

SPRINGER
DOI: 10.1007/s10854-017-7659-y

Keywords

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Funding

  1. Natural Science Foundation of China [11664008, 11364012, 11464009]
  2. Natural Science Foundation of Guangxi [2015GXNSFDA139033, 2014GXNSFAA118326]
  3. Research Start-up Funds Doctor of Guilin University of Technology [002401003281, 002401003282]
  4. Project of Outstanding Young Teachers' Training in Higher Education Institutions of Guangxi

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(1 - x)BaTiO3-xBi(Li0.5Nb0.5)O-3 [(1 - x)BT-xBLN, 0 <= x <= 0.1] lead-free ceramics were prepared via a conventional solid state reaction method. Raman spectra and X-ray diffraction results confirmed the phase transformation from tetragonal to pseudo cubic symmetry at 0 <= x <= 0.02. With adding Bi(Li0.5Nb0.5)O-3, the thermal stability of permittivity and dielectric loss of ceramics were improved. Especially, 0.9BT-0.1BLN ceramics exhibited good dielectric properties with small Delta epsilon/epsilon(25 degrees C) values (<= +/- 15%) in a wide temperature range of -61-160 degrees C, high relative permittivity (-1500-1750) and low dielectric loss (tan delta <= 0.02) from -60 to 200 degrees C, which indicates that BT-BLN is candidate for X8R devices.

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