3.8 Proceedings Paper

Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: signal-to-background optimization for imaging with high sensitivity

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Publisher

SPIE-INT SOC OPTICAL ENGINEERING
DOI: 10.1117/12.2529096

Keywords

X-ray microscopy; ptychography; tomography; signal-to-background ratio; spatial resolution; detection sensitivity

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The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent flux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.

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