Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 46, Issue 7, Pages 4497-4502Publisher
SPRINGER
DOI: 10.1007/s11664-017-5440-x
Keywords
Indium-gallium-zinc oxide; low temperature; inkjet printing; laser spike annealing; thin-film transistors
Categories
Funding
- Provincial Natural Science Foundation of Fujian, China [2014J01235]
Ask authors/readers for more resources
Inkjet-printed In-Ga-Zn oxide (IGZO) thin-film transistors (TFTs) have been fabricated at low temperature using laser spike annealing (LSA) treatment. Coffee-ring effects during the printing process were eliminated to form uniform IGZO films by simply increasing the concentration of solute in the ink. The impact of LSA on the TFT performance was studied. The field-effect mobility, threshold voltage, and on/off current ratio were greatly influenced by the LSA treatment. With laser scanning at 1 mm/s for 40 times, the 30-nm-thick IGZO TFT baked at 200A degrees C showed mobility of 1.5 cm(2)/V s, threshold voltage of -8.5 V, and on/off current ratio > 10(6). Our findings demonstrate the feasibility of rapid LSA treatment of low-temperature inkjet-printed oxide semiconductor transistors, being comparable to those obtained by conventional high-temperature annealing.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available