Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 46, Issue 12, Pages 6884-6894Publisher
SPRINGER
DOI: 10.1007/s11664-017-5729-9
Keywords
Cobalt ferrite; XRD; dielectric relaxation; impedance
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Funding
- CSIR [03/1183/10/EMR-II]
- DST [SR/FTP/PS-103/2009]
- DAE, India [2011/20/37P/03/BRNS/007]
- UGC, New Delhi
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Co1-x Zn (x) Fe2O4 ceramics with x = 0.00, 0.05, 0.10, 0.15 and 0.20 were synthesized by a modified citric acid sol-gel method. The crystalline phase of the samples was characterized by the powder x-ray diffraction technique (XRD) and the Rietveld analysis of the XRD patterns. The morphology and particle size were studied using field emission scanning electron microscopy. Fourier transform infrared spectroscopy studies were consistent with the XRD results. The impedance measurements were carried out from 100 Hz to 10 MHz at different temperatures from 40A degrees C to 300A degrees C. The frequency dispersion of dielectric was analyzed with a modified Debye equation. The activation energy derived from the dielectric constant and the impedance follows the Arrhenius law and are comparable with each other. The dielectric relaxation and impedance relaxation are correlated in terms of activation energy, show a good temperature stability of the dielectrics and are useful for their applications in microelectronic devices such as filters, capacitors, resonators, etc.
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