Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 221, Issue -, Pages 10-17Publisher
ELSEVIER
DOI: 10.1016/j.elspec.2017.03.010
Keywords
Near ambient pressure X-ray photoelectron spectroscopy; Oxygen evolution reaction; Pt and IrOx anodes
Categories
Funding
- Bundesministerium fur Bildung und Forschung through the joint Russian-German research project SYnchrotron and NEutron STudies for Energy Storage (SYNESTESia) [05K14EWA]
- Ministry of Education and Science of the Russian Federation [RFMEFI61614 x0007]
- Alexander-von-Humboldt foundation
Ask authors/readers for more resources
In this account the application of synchrotron radiation based X-ray photoelectron spectroscopy (XPS) for the investigation of electrochemically active gas-solid and liquid-solid interfaces will be discussed. The potential of Near Ambient Pressure XPS (NAP-XPS) for the estimation of the surface electronic structure of electrochemically active interfaces will be described by two examples. Thereto the oxygen evolution reaction (OER) over Pt and IrOx anodes will be introduced. In particular the analysis of XP core level spectra of IrOx requires the development of an appropriate fit model. Furthermore the design of reaction cells based on proton exchange membranes (PEM) and on electron transparent graphene membranes, which enables the investigation of liquid-gas and liquid-solid interfaces under electrochemical relevant conditions will be discussed. In the last part of this article a perspective to the EMIL project at the synchrotron radiation facility BESSY will be given. The purpose of this project is the implementation of two new beamlines enabling X-ray photoelectron spectroscopy in the X-ray regime from 80 eV-8 keV under reaction conditions. The extension to the so called tender X-ray regime will allow the release of higher kinetic energy photoelectrons which have a higher inelastic mean free path compared to photoelectrons excited by soft X-ray radiation and therefore will enable the investigation of solid-liquid interfaces under electrochemical reaction conditions. (C) 2017 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available