Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 220, Issue -, Pages 91-95Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.elspec.2016.12.013
Keywords
Multiwalled carbon nanotube; Soft X-ray absorption spectroscopy; Chemical-state analysis; Orientation; Oxygen content
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Funding
- Grants-in-Aid for Scientific Research [26390066] Funding Source: KAKEN
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Low-energy Ar ions (0.5-2 keV) were irradiated onto vertically aligned multiwalled carbon nanotube (VA-MWCNT) films, and the chemical states, orientation, and oxygen content of the irradiated VA-MWCNT films were investigated by soft X-ray absorption spectroscopy (XAS). After irradiation, two additional peaks appeared in the XAS spectra in the C K region, indicating a significant change in the electronic structure. Furthermore, it was found that the VA-MWCNT films were oxidized after irradiation. The results of chemical-state analyses of the XAS spectra in both the C K and 0 K regions indicated the formation of carboxyl groups (-COOH) on the surface of the VA-MWCNT films upon irradiation. The oxygen content of the VA-MWCNT films increased with increasing ion energy and fluence. (C) 2016 Elsevier B.V. All rights reserved.
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