4.3 Article

Proactive useless data flush architecture for nonvolatile SRAM using magnetic tunnel junctions

Journal

IEICE ELECTRONICS EXPRESS
Volume 17, Issue 5, Pages -

Publisher

IEICE-INST ELECTRONICS INFORMATION COMMUNICATION ENGINEERS
DOI: 10.1587/elex.17.20200032

Keywords

CMOS logic systems; power gating; SRAM; nonvolatile SRAM; magnetic tunnel junction

Funding

  1. VLSI design and education center, VDEC
  2. University of Tokyo
  3. Renesas Electronics Corp.

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A store energy and latency reduction architecture based on proactive useless data flush (PUDF) is proposed for nonvolatile SRAM (NV-SRAM) using magnetic tunnel junctions (MJTs). Prior to the store operation to the MTJs in the array, the PUDF architecture predicts store-unneeded blocks having useless data and shuts down these blocks in advance. As a result, the store energy and latency can be reduced depending on the proportion of store-unneeded blocks, which enhances the energy reduction efficiency of power gating (PG) using the NV-SRAM. The energy and latency characteristics are computationally analysed and experimentally verified using circuit parameters extracted from fabricated test-element-group (TEG) circuits of the NV-SRAM.

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