Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 729, Issue -, Pages 607-616Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2017.09.222
Keywords
Coating materials; Sol-gel processes; Crystal structure; Dielectric response
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Lead zirconate titanate (PZT) films prepared from a new chelate-based precursor solution were dip-coated onto ITO-coated glass substrates. ITO has been chosen to preserve the transparency necessary for the specific applications. The effects of chemistry and processing conditions are explored in solution-derived morphotropic composition PZT films. The PZT transformed directly from the amorphous phase into perovskite, without going through a pyrochlore intermediate stage. The PZT phase crystallized at significantly low temperature of 450 degrees C following conventional heat-treatment without necessitating special irradiations, rapid thermal annealing and/or particular substrates. Ferroelectric and dielectric properties were measured and compared for PZT films processed from two sol-gel precursor systems. A remanent polarization, Pr, of 7.5 mu C cm(-2), coercive field, Ec, of 18.7 kV cm(-1), dielectric constant, er, of 739, and loss value, tan(delta), of 0.04 were measured for PZT film post-annealed at 700 degrees C. (C) 2017 Elsevier B.V. All rights reserved.
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