Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 695, Issue -, Pages 302-310Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2016.10.207
Keywords
Effective atomic number; Bi2O3; Tenth value layer; Oxide glass; Radiation shielding
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In this study, Bi2O3 based glass system in composition xBi(2)O(3)-(80-x) B2O3-5TeO(2)-15SiO(2) where x = 50, 55, 60, 65, 70 and 75 wt % have been prepared for radiation shielding. The emitted gamma ray has been detected by 3 x 3 inch NaI(Tl) scintillation detector. The obtained results indicate that the values of the mass attenuation coefficient (mu(m)), effective atomic number (Z(eff)) and effective electron densities (N-el) of the glasses increase with the increasing of Bi2O3 concentration and decrease with increasing photon energy. The values of the half value layer (HVL) of the glasses were found to decrease with the increasing of Bi2O3 content. The experimental results have been observed in good agreement with the Xcom values for all the glass samples. (C) 2016 Elsevier B.V. All rights reserved.
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