Fully Synthesizable Low-Area Analogue-to-Digital Converters With Minimal Design Effort Based on the Dyadic Digital Pulse Modulation

In this paper, fully-synthesizable Successive Approximation Register (SAR) Analog-to-Digital Converters (ADCs) suitable for low-cost integrated systems are proposed both for voltage and current input. The proposed ADCs are digital in nature and are based on the Dyadic Digital Pulse Modulation (DDPM) Digital-to-Analog (DAC), instead of a traditional capacitive DAC. The proposed fully-digital ADC architectures enable low-effort design, silicon area reduction, and voltage scaling down to the near-threshold region. Compared to traditional analog-intensive designs, their digital nature allows easy technology and design porting, digital-like area shrinking across CMOS technology generations, and also drastically reduced system integration effort through immersed-in-logic ADC design. The voltage-input ADC architecture is demonstrated with a 40-nm testchip showing 3,000-mu m(2) area, 6.4-bit ENOB, 2.8kS/s sampling rate, 40.4dB SNDR, 49.7dB SFDR, and 3.1 mu Wpower at 1V. A current-input ADC is also demonstrated for direct current readout without requiring a trans-resistance stage. 40-nm testchip measurements show a 5-nA to 1-mu A input range, 4,970 mu m(2) area, 6.7-bit ENOB and 2.2-kS/s sample rate, at 0.94-mu W power. Compared to the state of the art, the proposed ADC architecture exhibits the highest level of design automation (standard cell), lowest area, and the unique ability to cover direct acquisition of both voltage and current inputs, suppressing the need for transresistance amplifier in current readout.