The Mapping of Technological Texture in Electrical Insulators

Correlation between local values of dielectric permittivity and electric potential in axially symmetric dielectric medium located into a constant external electric field was analyzed perpendicularly to the axis of symmetry. The simple experimental method for identification of dielectric profile of materials with mentioned symmetry was suggested on the basis of this correlation. Then the qualitative assessment of the technological texture of a ceramic blank designed for the production of very high voltage (VHV) insulators was done. Measured voltage differences on the surface of sample of the ceramic blank placed between two electrodes and connected to a source of constant electrical voltage was measured. The technological texture was evaluated in the form of a flat map of curves with the same values of mentioned voltage differences.