Journal
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE
Volume 19, Issue 1, Pages 19-28Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.cossms.2014.09.007
Keywords
Rutherford backscattering spectrometry; Raman spectroscopy; X-ray diffraction; Small-angle X-ray scattering; Positron annihilation spectroscopy; Ion beam modification
Funding
- U.S. Department of Energy, Office of Basic Energy Sciences, Materials Sciences and Engineering Division
- SAXS/WAXS beam line at the Australian Synchrotron
- Australian Research Council
- Centre National de la Recherche (CNRS)
- Universite Paris-Sud
- Universite de Limoges
- Academy of Finland
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Understanding the mechanisms of damage formation in materials irradiated with energetic ions is essential for the field of ion-beam materials modification and engineering. Utilizing incident ions, electrons, photons, and positrons, various analysis techniques, including Rutherford backscattering spectrometry (RBS), electron RBS, Raman spectroscopy, high-resolution X-ray diffraction, small-angle X-ray scattering, and positron annihilation spectroscopy, are routinely used or gaining increasing attention in characterizing ion beam modified materials. The distinctive information, recent developments, and some perspectives in these techniques are reviewed. Applications of these techniques are discussed to demonstrate their unique ability for studying ion-solid interactions and the corresponding radiation effects in modified depths ranging from a few nm to a few tens of mu m, and to provide information on electronic and atomic structure of the materials, defect configuration and concentration, as well as phase stability, amorphization and recrystallization processes. Such knowledge contributes to our fundamental understanding over a wide range of extreme conditions essential for enhancing material performance and also for design and synthesis of new materials to address a broad variety of future energy applications. (C) 2014 Elsevier Ltd. All rights reserved.
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