Journal
IEEE-ASME TRANSACTIONS ON MECHATRONICS
Volume 22, Issue 1, Pages 371-380Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMECH.2016.2574892
Keywords
Atomic force microscopy (AFM) imaging; internal model control; nanopositioning; spiral scan; video rate
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Funding
- Australian Research Council
- University of Newcastle Australia
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We report on the application of internal model control for accurate tracking of a spiral trajectory for atomic force microscopy (AFM). With a closed-loop bandwidth of only 300 Hz, we achieved tracking errors as low as 0.31% of the scan diameter and an ultravideo frame rate for a high pitch (30 nm) spiral trajectory generated by amplitude modulation of 3 kHz sinusoids. Design and synthesis procedures are proposed for a smooth modulating waveform to minimize the steady-state tracking error during sequential imaging. To obtain AFM images under the constant-force condition, a high bandwidth analogue proportional-integral controller is applied to the damped z-axis of a flexure nanopositioner. Efficacy of the proposed method was demonstrated by artifact-free images at a rate of 37.5 frames/s.
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