Journal
SCIENCE ADVANCES
Volume 6, Issue 44, Pages -Publisher
AMER ASSOC ADVANCEMENT SCIENCE
DOI: 10.1126/sciadv.abc0332
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Funding
- European Research Council under the European Union's Horizon 2020 Research and Innovation Programme [802567, 678734]
- Zuckerman STEM Leadership Program
- Technion's Leaders in Science and Technology Program
- Israel Science Foundation [450/18]
- Israeli Innovation Authority [880326]
- European Research Council (ERC) [678734] Funding Source: European Research Council (ERC)
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The shape of a surface, i.e., its topography, influences many functional properties of a material; hence, characterization is critical in a wide variety of applications. Two notable challenges are profiling temporally changing structures, which requires high-speed acquisition, and capturing geometries with large axial steps. Here, we leverage point-spread-function engineering for scan-free, dynamic, microsurface profiling. The presented method is robust to axial steps and acquires full fields of view at camera-limited framerates. We present two approaches for implementation: fluorescence-based and label-free surface profiling, demonstrating the applicability to a variety of sample geometries and surface types.
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