Journal
MATERIALS RESEARCH EXPRESS
Volume 7, Issue 11, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/2053-1591/abc58b
Keywords
Thin film growth; RHEED; RBS; Stoichiometry; Molecular beam epitaxy; Atomic force microscopy
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Strontium cobaltite (SrCoO2.5+delta, SCO) is a fascinating material because of its topotactic structural phase transition caused by a change in oxygen stoichiometry. In the brownmillerite phase (delta = 0) it is an insulating antiferromagnet whereas in the perovskite phase (delta = 0.5) it is a conducting ferromagnet. In contrast, the impact of the varying Co/Sr stoichiometry on the structure has not yet been studied in SCO thin films. Using molecular beam epitaxy we have fabricated SCO thin films of varying Co/Sr stoichiometry. Films with Co excess exhibit a brownmillerite crystal structure with CoO precipitates within the thin film and on the surface. Co deficient films are amorphous. Only for 1:1 stoichiometry a pure brownmillerite structure is present. We find a clear dependence of the Reflection High Energy Electron Diffraction (RHEED) pattern of these thin films on the stoichiometry. Interestingly, RHEED is very sensitive to a Co excess of less than 12% while x-ray diffraction fails to reveal that difference. Hence, using RHEED, the stoichiometry of SCO can be evaluated and tuned in-situ to a high degree of precision, which allows for a quick adjustment of the growth parameters during a sample series.
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