Journal
IEEE TRANSACTIONS ON POWER DELIVERY
Volume 32, Issue 4, Pages 1688-1695Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPWRD.2016.2519604
Keywords
Electrical insertion time; mechanical insertion time (MIT); prestrike; rate of decay of dielectric strength (RDDS); series preinsertion resistors; shunt PIR; thermal energy
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Preinsertion resistors (PIR) are used in combination with circuit breakers to absorb switching transients and come into effect during the closing operation of the breaker. It is mainly used for rated voltages equal to or higher than 420 kV for line lengths above 200 km. Although it is an important component, power testing of complete PIR is very complicated and not well defined. Therefore, an attempt has been made in this paper to provide alternative test methods for power testing of PIR without compromising its important parameters. Due to high energy requirements and limitations of the test laboratory, a multipart testing of PIR is necessary to prove its thermal capability and dielectric behavior. Before proceeding with the complete PIR test, the critical parameters of PIR, such as mechanical insertion time, rate of decay of dielectric strength of the interrupter, and PIR switch, etc., should be verified with testing. These test procedures are also explained in detail along with a method to theoretically evaluate electrical insertion time for different network conditions. The series PIR configuration for themetal-enclosed SF6 system has been considered in this paper.
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