Journal
DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS IX
Volume 11397, Issue -, Pages -Publisher
SPIE-INT SOC OPTICAL ENGINEERING
DOI: 10.1117/12.2558996
Keywords
fringe projection; uniaxial 3D optical metrology; defocus analysis; deconvolution
Funding
- Iowa State University (College of Engineering Faculty Startup fund)
- National Natural Science Foundation of China (NSFC) [61603360]
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This paper introduces a novel uniaxial fringe projection profilometry (FPP) called active shape from projection defocus profilometry (ASPDP), which utilizes the sharpness analysis of binary fringe patterns to quantify the defocus level. Compared with previous uniaxial FPP methods, our work first utilizes a pinhole defocus model to account for three-dimensional reconstruction. Since defocused fringe pattern can be modeled as the original pattern convoluted with a point spread function (PSF), pixel-wise defocus level can be quantified with this PSFs kernel using temporal Fourier analysis. In this research, calibration is achieved by using a mechanical translation device, and determined by rational polynomial fitting to establish defocus-depth relationship. The experiment demonstrates that this method can provide an accurate reconstructed 3D geometry without shadows.
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