Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 64, Issue 11, Pages 2782-2793Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2017.2754878
Keywords
Dose rate; fault tolerance; single-event effects (SEE); space radiation; space radiation effects; spacecraft systems engineering; Van Allen belts
Funding
- NASA Living With a Star Program Office at NASA Goddard Space Flight Center
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Electronic devices on the Van Allen Probes mission have experienced more than a thousand single-event effects (SEE) during the 4.5 years of transit through the inner and outer earth trapped radiation belts. The majority of these SEE have been due to trapped protons determined by the orbit timing and the dose rate response of the engineering radiation monitor. Fault tolerant systems engineering and spacecraft operation have enabled a successful mission to date without a safe mode or spacecraft emergency.
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