Journal
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Volume 65, Issue 1, Pages 119-127Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2016.2613527
Keywords
Dielectric transmission line; effective dielectric constant (EDC); millimeter-wave (mmW); narrowed dielectric microstrip line (N-DML); printed circuit board (PCB) fabrication technology
Categories
Funding
- National Natural Science Foundation of China [61372056]
- University Grants Council of Hong Kong [GRF 9041907]
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We investigated a dielectric transmission line consisting of three dielectric substrate layers for millimeter-wave (mmW) applications. This line is referred to as a narrowed dielectric microstrip line (N-DML). The effective dielectric constant method is used to analyze the propagation characteristics of the N-DML. The result of the analysis of the normalized phase constant is consistent with the simulation. For demonstration, two J-band N-DML prototypes of different lengths with transitions to rectangular waveguides were designed, fabricated, and measured. Good agreement between the simulated and measured results is observed. In particular, due to its nonmetal structure, the N-DML shows a low average attenuation constant of only 0.52 dB/cm over 220-280 GHz in the experiment. Due to its good performance, ease of fabrication, low loss, and low cost, the N-DML is a suitable candidate for various mmW applications.
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