4.6 Article

Graphene Nanoribbon Tunnel Field-Effect Transistor via Segmented Edge Saturation

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 64, Issue 6, Pages 2694-2701

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2017.2691360

Keywords

Edge saturation; graphene nanoribbon (GNR); subthreshold swing (SS); tunnel FET (TFET)

Funding

  1. National Natural Science Foundation of China [61574102, 61404094, 61204096]
  2. Fundamental Research Fund for the Central Universities, Wuhan University [2042015kf0174, 2042016kf0189]
  3. China Postdoctoral Science Foundation [2012T50688]
  4. Natural Science Foundation of Hubei Province, China [2014CFB694]
  5. Science Foundation of Jiangsu Province, China [BK20141218]

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In this paper, segmented edge saturation (SES) is proposed as a novel method to design high-performance tunnel FETs (TFETs) using smooth graphene nanoribbon (GNR). When the edges of a smooth GNR are saturated by different elements in its different segments, the energy gaps (E-g) of these segments can be tuned. Therefore, the tunneling and blocking effects are achieved simultaneously by reducing and enlarging the E-g of GNR in its specific regions. Both high on-to-off current (I-ON/I-OFF) ratio and large I-ON are obtained. Simulation results show that the I-OFF of the SES GNR TFET is below 1 x 10(-4) mu A/mu m and the I-ON reaches 2000 mu A/mu m at 0.4-V supply voltage. Detailed transport mechanisms of this TFET are investigated in comparisons with its uniform saturation counterparts. Dynamic performance and scaling ability analyzes are also carried out. The largest intrinsic delay and switching energy are only 0.17 ps and 0.09 fJ/mu m. Meanwhile, it can maintain high I-ON/I-OFF ratios when the channel length is scaled down to several nanometers. The discussions on GNR edge roughness suggest that the roughness should be avoided for better I-ON behaviors. The good performance of the TFET highlights the capabilities of SES in the developments of GNR tunnel devices.

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