Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 64, Issue 2, Pages 407-411Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2016.2636135
Keywords
Current degradation; extended Poole; Frenkel (PF) emission; GaN Schottky diodes; shallow donor-like defect model
Funding
- National Natural Science Foundation of China [61504050, 11604124]
- Natural Science Foundation of Jiangsu Province [BK 20130156, BK20140168, BK20150158]
- Fundamental Research Funds for the Central Universities [JUSRP51628B]
- Summit of the Six Top Talents Program of Jiangsu Province [2013-DZXX-027]
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In this paper, we perform a comprehensive study on the reverse current degradation mechanisms in Au/Ni/n-GaN Schottky diodes based on an in-depth understanding on the defect-related current transport mechanisms. Instead of traditional Poole-Frenkel (PF) emission model, an extended bulk-limited PF transport process, including the compensation effect, is adopted to explain the variation of the PF current slope as a function of the stress time, which majorly takes place inside the depletion region near the neutral semiconductor side. Based on the electrostatic analysis, we develop a shallow donor-like defects model to address the current degradation kinetics, which states that the energetic electrons produced by Fowler-Nordheim tunneling can induce significant Joule heating effect during the subsequent drift move of field, and give rise to the formation of the donor-like defects, and in turn enhance the surface electrical field to cause a significant increase of the tunneling component, in good agreement with the emission microscope observations.
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