Journal
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume 17, Issue 4, Pages 713-721Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TDMR.2017.2749639
Keywords
Solid state drives; SSD; reliability; RAID; data loss; bit errors
Funding
- Universita degli Studi di Ferrara through the initiative Bando per il finanziamento della ricerca scientifica Fondo per l'Incentivazione alla Ricerca
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Ensuring data protection in solid state drives (SSDs) is vital in enterprise application scenario. However, as the reliability of their storage medium, namely, the NAND Flash, is decreasing at the same pace of the technology scaling, this activity is becoming nontrivial. The evaluation of different recovery strategies that employ complex error-correction codes and second-level error correction is becoming a de facto. In this paper, we model the endurance reliability of an advanced data protection methodology like the intradisk redundant array of independent disks (RAIDs) applied on mid-1X triple level cell NAND Flash-based SSD. The performed investigations include a parametric analysis of the uncorrectable bit-error rate. By developing a dedicated discrete-time Markov-chain model of an SSD, we evidenced that intradisk RAID5 and RAID6 allow achieving an inherent reliability level compliant with the qualification target for enterprise SSD. Finally, we provide a global picture of the disk economy when intradisk RAID is implemented.
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