4.7 Review

Scanning Approaches of 2-D Resistive Sensor Arrays: A Review

Journal

IEEE SENSORS JOURNAL
Volume 17, Issue 4, Pages 914-925

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSEN.2016.2641001

Keywords

2-D resistive sensor array; scanning approach; measurement error; readout circuit; circuit model

Funding

  1. Specialized Research Fund for the Doctoral Program of Higher Education [20130092110060]
  2. National Major Scientific Equipment RD Project [ZDYZ2010-2]
  3. Natural Science Foundation of China [61571113, 61304205, 61502240]
  4. Natural Science Foundation of Jiangsu Province [BK20141002]

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With scanning approaches of low complexity, the 2-D resistive sensor arrays (RSAs) are used to extract the distribution of sensed variable values (e.g., physical pressure) over the sensing area. This review surveys the scanning approaches of the 2-D RSAs, their evaluation methods, and their applications. The principle of the 2-D RSA with the scanning approach is introduced first. Then, different scanning approaches of RSAs are illustrated. The scanning approaches of RSAs are mainly categorized into the inserting diode method, the inserting transistor method, the passive integrator method, the resistance matrix approach, the incidence matrix approach, the voltage feedback method, the zero potential method, and so on. Next, various evaluation methods of the scanning approaches are presented. The scanning approach's evaluation methods are categorized into testing of the actual system, analyzing with circuit simulation software, and analyzing with test model. Followed, typical applications of the 2-D RSAs with the scanning approaches and their special requirements are analyzed. Finally, the characteristics of various typical scanning approaches and their development tendency are discussed and investigated in detail.

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