4.6 Article

Schottky-MOS Hybrid Anode AlGaN/GaN Lateral Field-Effect Rectifier With Low Onset Voltage and Improved Breakdown Voltage

Journal

IEEE ELECTRON DEVICE LETTERS
Volume 38, Issue 10, Pages 1425-1428

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2017.2737520

Keywords

AlGaN/GaN; lateral field-effect rectifier (LFER); Schottky contact; breakdown voltage; punch through

Funding

  1. National Natural Science Foundation of China [11634002, 61204099, 61361166007]
  2. National Science and Technology Major Project 02 [2013ZX02308-003]
  3. National Key Research and Development Program of China [2016YFB0400200]

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For devices with a 15 micron anode-to-cathode distance, nearly 1.5 times increase in the blocking (breakdown) voltage (from 692 to 1030 V) has been achieved by replacing the alloyed Ohmic contact at the anode electrode of the conventional MOS gated hybrid-anode lateral field-effect rectifier (CMLFER) with a low barrier Schottky contact. The new Schottky-MOS hybrid-anode lateral field-effect rectifier is found to offer comparable low onset voltage (V-ON of 0.68 +/- 0.13 versus 0.65 +/- 0.11 V for CMLFER) independent of the anode-to- cathode distance. The immunity of the punch through caused by drain induced barrier lowering effect is obtained through the low barrier Schottky contact in anode, which is believed to be responsible for the reduction in the leakage current, and the improvement of rectifier breakdown voltage.

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