Journal
IEEE ELECTRON DEVICE LETTERS
Volume 38, Issue 10, Pages 1405-1408Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2017.2739189
Keywords
Spherical Al nanoparticles (NPs); deep ultraviolet (DUV); localized surface plasmon resonance (LSPR); MSM photodiode (PD); silicon carbide (SiC)
Categories
Funding
- National Natural Science Foundation of China [61404085]
Ask authors/readers for more resources
The size controlled Al nanoparticles (NPs) were prepared by magnetron sputtering and subsequent rapid thermal annealing. Significant deep ultraviolet (DUV) detection enhancement is demonstrated on 4H-SiC metal-semiconductor-metal (MSM) ultraviolet photodiodes (PDs) by introducing the coupling of localized surface plasmon resonance (LSPR) from Al NPs. The peak responsivity of 165 mA/W and quantum efficiency of 93% at 220-nm wavelength are achieved under deuterium lamp illumination when 10-V bias is applied, which is 3.93 times than that without Al NPs. LSPR at wavelength as low as 220 nm is the shortest one ever reported in Al NPs.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available