Journal
IEEE COMMUNICATIONS LETTERS
Volume 21, Issue 12, Pages 2686-2689Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LCOMM.2017.2747510
Keywords
Stochastic geometry; Matern cluster process; contact distance; and nearest-neighbor distance
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Funding
- US NSF [CCF-1464293, CNS-1617896]
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In this letter, we derive the cumulative density function of the nearest neighbor and contact distance distributions of the Matern cluster process (MCP) in R-2. These results will be useful in the performance analysis of many real-world wireless networks that exhibit inter-node attraction. Using these results, we concretely demonstrate that the contact distance of the MCP stochastically dominates its nearest-neighbor distance as well as the contact distance of the homogenous Poisson point process with the same density.
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