Peculiarities of the Composition and Morphology of CdxPb1- xS Films Formed on Various Substrates

Chemical deposition from aqueous solutions of films of substitutional CdxPb1 - S-x solid solutions with a cubic B1 structure on substrates made of monocrystalline silicon, sitall, conductive ITO coating, and a glass slide is carried out. A comparative analysis of films deposited on substrates made of various materials reveals a number of peculiarities associated with their morphology, granulometric, elemental and phase composition. To improve the quantitative assessment of the structural parameters of CdxPb1 - S-x films obtained on various substrates, the profiles of diffraction reflections are proposed to be described by three- or two-phase models, taking into account the background of diffuse scattering from an amorphous material or excluding reflections from the crystalline material of the substrate. X-ray diffraction, XPS spectroscopy, and optical studies have shown that the synthesized films contain, in addition to the CdxPb1 - S-x phase, impurity wide-gap compounds of Pb(OH)(2), PbCO3 center dot xPb(OH)(2), and CdS.