Journal
2020 47TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
Volume -, Issue -, Pages 913-920Publisher
IEEE
DOI: 10.1109/pvsc45281.2020.9300774
Keywords
Image registration; CIGS solar cells; X-ray microscopy; X-ray fluorescence (XRF); X-ray beam induced current (XBIC); Gaussian filter
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Scanning probe measurements are an indispensable tool of solar cell research today, and the compatibility with simultaneous acquisition of complementary measurement modes is a particular strength. However, multi-modal data acquisition is often limited by different scan-parameter requirements. As a consequence, the modalities may be assessed subsequently rather than simultaneously. In this instance, image registration serves as a tool to align two-dimensional datasets at nanoscale. Here, we showcase an example of two subsequent scanning Xray microscopy measurements of solar cells with a Cu(In,Ga)Se-2 absorber, the first measurement being optimized for X-ray beam induced current and the second for X-ray fluorescence. We discuss different approaches and pitfalls of image registration and its potential combination with Gaussian filtering. This finally allows us to proceed with the investigation of point-by-point correlations.
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