Journal
2020 45TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ)
Volume -, Issue -, Pages -Publisher
IEEE
DOI: 10.1109/IRMMW-THZ46771.2020.9370894
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In this work we present a new approach to enhance the measurement speed and signal-to-noise ratio of scattering-type scanning near-field optical microscopy (s-SNOM) systems aiming for time- domain operation at terahertz frequencies. It is based on a standard atomic-force-microscope (AFM) tip that is supplemented with an integrated THz source. This device is offering an efficient solution to reduce coupling losses between THz pulse emitter and the scattering tip - one of the main performance limiting factors in current state-of-the-art systems.
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