A novel scattering-type SNOM-tip featuring a micro-integrated bias-free optically driven terahertz pulse emitter

In this work we present a new approach to enhance the measurement speed and signal-to-noise ratio of scattering-type scanning near-field optical microscopy (s-SNOM) systems aiming for time- domain operation at terahertz frequencies. It is based on a standard atomic-force-microscope (AFM) tip that is supplemented with an integrated THz source. This device is offering an efficient solution to reduce coupling losses between THz pulse emitter and the scattering tip - one of the main performance limiting factors in current state-of-the-art systems.