☆ 3.8 Proceedings Paper

Sub-ns Polarization Switching in 25nm FE FinFET toward Post CPU and Spatial-Energetic Mapping of Traps for Enhanced Endurance

2020 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM) (2020)

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Sub-ns Polarization Switching in 25nm FE FinFET toward Post CPU and Spatial-Energetic Mapping of Traps for Enhanced Endurance

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